The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Dec. 01, 2003
Kuo-ming Wu, Hsinchu, TW;
Shih-chung Yin, Hsinchu, TW;
Kuo-Ming Wu, Hsinchu, TW;
Shih-Chung Yin, Hsinchu, TW;
Mediatek Inc., Hsinchu, TW;
Abstract
An apparatus for branch metric computation and add-compare-select operation in a rate 1/n Viterbi decoder with a constraint length of K. The apparatus of the invention includes a branch metric generator and an add-compare-select unit. The branch metric generator calculates a plurality of branch metrics each of which is a measure between a currently received data symbol and a corresponding branch label. The add-compare-select unit can generate respective decision bits for a pair of odd and even states at next instant with a novel pre-computational architecture. Further, a local winner between the odd and even states is predetermined in a manner providing reduction of the activity required by the computation. Thus the add-compare-select unit outputs a path metric of the local winner, whereby a saving of half the output number of path metrics is achieved.