The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Jan. 22, 2002
Applicants:

William L. Duncan, Berthoud, CO (US);

Wayne Ihde, Boulder, CO (US);

Michael Tibbetts, Longmont, CO (US);

Inventors:

William L. Duncan, Berthoud, CO (US);

Wayne Ihde, Boulder, CO (US);

Michael Tibbetts, Longmont, CO (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a method, system, and an article of manufacture for detecting errors while accessing a storage device. A host system writes an identical initialization pattern into each block of a plurality of blocks while formatting the storage device. Each block of the plurality of blocks has a checksum field capable of containing a value. Any host system generates an error when data from a retrieved block from the plurality of blocks computes to a checksum that is different from the value contained within the checksum field for the retrieved block, and the retrieved block does not contain the initialization pattern.


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