The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Jul. 07, 2003
Applicants:

Charutosh Dixit, Mountain View, CA (US);

William Shen, San Jose, CA (US);

Inventors:

Charutosh Dixit, Mountain View, CA (US);

William Shen, San Jose, CA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system of testing data retention of memory is provided. An embodiment of the method of testing data retention of memory comprises: writing first data to a first memory sub-group during a first time period; writing second data to a second memory sub-group during a second time period subsequent to said first time period; pausing for a predetermined time interval during a third time period subsequent to said second time period; reading a first one of said first and second data during a fourth time period subsequent to said third time period; reading a second one of said first and second data during a fifth time period subsequent to said fourth time period; and comparing said first and second ones of read data to expected results to determine data retention capabilities of said first and second memory sub-groups.


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