The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

May. 05, 2003
Applicant:

Thilo Opaterny, Nuernberg, DE;

Inventor:

Thilo Opaterny, Nuernberg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

When systems controlled using a program logic, such as automation systems, are started up, it is necessary to observe individual program areas specifically. Program areas of this type are usually described by one or more modules of a program. This presents the problem that, in order to obtain an accurate analysis, the requests for these modules have to be identified in connection with the modules themselves, since they are ordinarily used multiple times. The present testing method and testing device are used to calculate and display a hierarchical request tree that shows the requests corresponding to a selected module. One or more requests for the selected module can be selected for observation by selecting individual lines of this request tree.


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