The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

May. 30, 2002
Applicants:

Cong Q. Khieu, San Jose, CA (US);

Louise Gu, Fremont, CA (US);

Inventors:

Cong Q. Khieu, San Jose, CA (US);

Louise Gu, Fremont, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01); G06F 1/12 (2006.01); H03L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method and circuit for variably controlling a delay line for a read data capture timing window. In one embodiment, the circuit includes a variably controlled delay circuit coupled to a FIFO. The variably controlled delay circuit receives an input strobe signal. The variably controlled delay circuit also receives a multibit control code. The variably controlled delay circuit transmits the input strobe signal after a time delay, wherein the time delay varies according to the multibit control code. The FIFO is coupled to the variably controlled delay circuit and receives the time delayed strobe signal therefrom. The FIFO receives an input data bit signal. The FIFO stores the input data bit signal in response to receiving the time delayed strobe signal.


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