The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Jan. 26, 2001
Thomas A. Mcphee, Hopewell Junction, NY (US);
Michael E. Cropp, LaGrangeville, NY (US);
Donald Diangelo, Fishkill, NY (US);
Alberto H. Gay, Aguadilla, PR (US);
Carmella Pemberton, Wappingers Falls, NY (US);
Joseph Saltarelli, Pleasant Valley, NY (US);
Nicholas L. Volkringer, Southbury, CT (US);
John J. Demarco, Marlboro, NY (US);
Thomas A. McPhee, Hopewell Junction, NY (US);
Michael E. Cropp, LaGrangeville, NY (US);
Donald Diangelo, Fishkill, NY (US);
Alberto H. Gay, Aguadilla, PR (US);
Carmella Pemberton, Wappingers Falls, NY (US);
Joseph Saltarelli, Pleasant Valley, NY (US);
Nicholas L. Volkringer, Southbury, CT (US);
John J. DeMarco, Marlboro, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present invention provides a method for controlling production or manufacturing costs by obtaining yield measurements of unit manufacturing for a multiplicity of products or production lines having a plurality of processes which includes determining a started units number for the plurality of processes. The method further includes determining a cost per unit for each unit of the plurality of processes, and calculating an expected approved units number for the plurality of processes. The expected approved units number is calculated by multiplying the started units number by an expected yield measurement. The method next includes calculating an actual approved units number for each of the plurality of processes by multiplying the started units number by an actual yield measurement, and calculating an unapproved units number for each of the plurality of processes by subtracting the expected approved units number from the actual approved units number. The method then includes calculating cost of yield measurements for the plurality of processes by multiplying the unapproved units number by the cost per unit, and providing a comparison of the cost of yield measurements for the plurality of processes.