The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Aug. 27, 2004
Scott A. Boyden, Knoxville, TN (US);
Stephen Piche, Austin, TX (US);
Scott A. Boyden, Knoxville, TN (US);
Stephen Piche, Austin, TX (US);
Alstom Technology Ltd., Baden, CH;
Abstract
At least one of the multiple process parameters (MPPs) is a controllable process parameter (CTPP) and one is a targeted process parameter (TPP). The process also has a defined target limit (DTV) representing a first limit on an actual average value (AAV) of the TPP. A first logical controller predicts future average values (FAVs) of the TPP based on the AAVs of the TPP over a first prior time period and the DTV. A second logical controller establishes a further target limit (FTV) representing a second limit on the AAV of the TPP based on one or more of the predicted FAVs, and also determines a target set point for each CTPP based on the AAVs of the TPP over a prior time period and the FTV. The second logical controller directs control of each CTPP in accordance with the determined target set point.