The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Mar. 16, 2004
Applicants:

Paul F. Dietrich, Seattle, WA (US);

Gregg Scott Davi, Milpitas, CA (US);

Robert J. Friday, Los Gatos, CA (US);

Inventors:

Paul F. Dietrich, Seattle, WA (US);

Gregg Scott Davi, Milpitas, CA (US);

Robert J. Friday, Los Gatos, CA (US);

Assignee:

Airespace, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, apparatuses, and systems directed to a wireless node location mechanism that uses a signal strength weighting metric to improve the accuracy of estimating the location of a wireless node based on signals detected among a plurality of radio transceivers. In certain implementations, the wireless node location mechanism further incorporates a differential signal strength metric to reduce the errors caused by variations in wireless node transmit power, errors in signal strength detection, and/or direction-dependent path loss. As opposed to using the absolute signal strength or power of an RF signal transmitted by a wireless node, implementations of the present invention compare the differences between signal strength values detected at various pairs of radio receivers to corresponding differences characterized in a model of the RF environment. One implementation of the invention searches for the locations in the model between each pair of radio receivers where their signal strength is different by an observed amount.


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