The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Feb. 13, 2002
Applicants:

Tetsuya Uda, Yokohama, JP;

Hiroshi Masuda, Yokohama, JP;

Hirofumi Nakano, Yokohama, JP;

Eita Miyasaka, Yokohama, JP;

Satoshi Asamizu, Yokohama, JP;

Inventors:

Tetsuya Uda, Yokohama, JP;

Hiroshi Masuda, Yokohama, JP;

Hirofumi Nakano, Yokohama, JP;

Eita Miyasaka, Yokohama, JP;

Satoshi Asamizu, Yokohama, JP;

Assignee:

Hitachi LTD, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 14/02 (2006.01); H04B 10/00 (2006.01); H01S 3/00 (2006.01); H01B 10/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

In the WDM systems, the OSNR and the signal loss among the optical signals are substantially minimized at the receiving terminal to combat the SRS effects. An equal amount of the signal loss is expected for every span in the transmission path so that the optical amplifier gain tilt is not affected among a number of wavelength frequencies in the optical signal. This is accomplished by controlling the amplification process according to a feedback from the monitoring units for monitoring the optical signal.


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