The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Jul. 10, 2002
Walter D. Clark, Fullerton, CA (US);
Omar Aboutalib, Diamond Bar, CA (US);
Liya Su, San Gabriel, CA (US);
Walter D. Clark, Fullerton, CA (US);
Omar Aboutalib, Diamond Bar, CA (US);
Liya Su, San Gabriel, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
The present invention includes a method for analyzing an image wherein elements defining a path within a two-dimensional image are received from a prescreener. A Sobel operator may be applied to the region around each of the elements of the chain to obtain a corresponding array of gradient directions. An angle correction may be applied to any of the gradient directions that goes beyond the highest value (in radian measure; the Pi −Pi transition), to obtain an array of gradient directions free of any artificial jumps in value. The gradient direction array (Sobel chaincode) can have its bandwidth taken to determine a single number of straightness so as to identify extremely straight edges, (manmade objects) from less straight edges (natural objects). A similar process can be used to analyze contours for straight sections, which are also parallel. These two and other filters applied to the gradient array can be part of a feature suite, for feature space analysis.