The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Jun. 26, 2003
Ole Klembt Andersen, Eindhoven, NL;
Jacobus M. Den Hollander, Eindhoven, NL;
Ole Klembt Andersen, Eindhoven, NL;
Jacobus M. Den Hollander, Eindhoven, NL;
Koninklijke Philips Elelctronics N.V., Eindhoven, NL;
Abstract
Tilt (θ(r, φ)) is measured in a measuring location (P(r, φ) optical disc (). A pivotable objective lens () is brought to a first focus measuring location such as to focus a light beam () in a first anchor point (P(r−Δr, φ))having the same angular coordinate φ as said measuring location (P(r, φ)) and having a small radial distance Δrfrom said measuring location. The objective lens is brought to a second focus measuring location such as to focus the light beam in a second anchor point (P(r+Δr, φ)) having the same angular coordinate φ as said measuring location and having a small radial distance Δrfrom said measuring location, wherein said first and second anchor pints are located on opposite sides of said measuring location. Tilt in said measuring location is calculated from the coordinates of said two focus measuring locations of said objective lens.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile