The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Sep. 16, 2002
Applicants:

Ronald S. Weinstein, Tucson, AZ (US);

Michael R. Descour, Tucson, AZ (US);

Chen Liang, Tucson, AZ (US);

Peter H. Bartels, Tucson, AZ (US);

Roland V. Shack, Tucson, AZ (US);

Inventors:

Ronald S. Weinstein, Tucson, AZ (US);

Michael R. Descour, Tucson, AZ (US);

Chen Liang, Tucson, AZ (US);

Peter H. Bartels, Tucson, AZ (US);

Roland V. Shack, Tucson, AZ (US);

Assignee:

DMetrix Inc., Tucson, AZ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-axis imaging system and method wherein a plurality of optical elements are arranged to produce in image space thereof respective images of respective regions in object space thereof, and a plurality of image sensing elements corresponding to respective optical elements are disposed in image space of the image sensing elements to capture images of the respective regions. At least one baffle is positioned along an optical pathway of at least one of the optical elements to block light from outside the field of view of the one of the optical elements from reaching a corresponding image sensing element.


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