The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Jun. 06, 2005
Wayne D. Jung, Morton Grove, IL (US);
Russell W. Jung, Morton Grove, IL (US);
Walter W. Sloan, Lake Bluff, IL (US);
Alan R. Loudermilk, Chigago, IL (US);
Wayne D. Jung, Morton Grove, IL (US);
Russell W. Jung, Morton Grove, IL (US);
Walter W. Sloan, Lake Bluff, IL (US);
Alan R. Loudermilk, Chigago, IL (US);
JJL Technologies LLC, Morton Grove, IL (US);
Abstract
Optical properties of an object are determined via light provided to the object via a probe tip including a plurality of light source/light receiver pairs. Light is received from a first light source/light receiver pair, and the first light source/light receiver pair is arranged so that a first measurement generates data based on light from the object received from a first average optical depth or first thickness sensitivity. Light is received from a second light source/light receiver pair, and the second light source/light receiver pair is arranged so that a second measurement generates data based on light from the object received from a second average optical depth or a second thickness sensitivity. The second average optical depth is different from the first average optical depth. Optical properties of the object are determined based on the data generated by the first and second measurements.