The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Dec. 05, 2003
Harold R. Van Aken, Wallkill, NY (US);
Shreyance Rai, Morrisville, NC (US);
Mark A. Lindsay, Cary, NC (US);
Richard J. Knapp, Hillsborough, NC (US);
Harold R. Van Aken, Wallkill, NY (US);
Shreyance Rai, Morrisville, NC (US);
Mark A. Lindsay, Cary, NC (US);
Richard J. Knapp, Hillsborough, NC (US);
GretagMacbeth, LLC, New Windsor, NY (US);
Abstract
Systems and methods for selectively manipulating and/or restandardizing color measurement or spectral data are provided. The color measurement or spectral data may be advantageously restandardized based on a selected color coordinate system using data transform(s) or delta profile(s). Users of the systems/methods are able to mix or employ color-measuring instrument types more easily and effectively by selectively causing a first instrument produced by a first color-measuring instrument manufacturer to provide color measurement data according to a color measurement standard of another color-measuring instrument manufacturer. Selective transformation of color measurement data gathered by the first manufacturer's color-measuring instrument is facilitated, so that the resultant color measurement data may be evaluated as though it was generated by the other manufacturer's color-measuring instrument.