The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Nov. 07, 2003
Applicants:

Takeo Tanaami, Musashino, JP;

Yumiko Sugiyama, Musashino, JP;

Saya Satou, Musashino, JP;

Hisao Katakura, Musashino, JP;

Inventors:

Takeo Tanaami, Musashino, JP;

Yumiko Sugiyama, Musashino, JP;

Saya Satou, Musashino, JP;

Hisao Katakura, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Detector calibration methods are described which enable the measurement of absolute power. The method includes using a power meter with traceability to the national standard for optical power to calibrate the power of each photodetector device of a detector with photodetector device arrays arranged in one dimension or two dimensions and to calibrate the output signals of the detector making it possible to measure the spatial distribution of a light source's power and also values of optical power with traceability to the national standard directly from the output signals of the detector.


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