The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Aug. 28, 2003
Fang F. Dong, Waukesha, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Bruce M. Dunham, Mequon, WI (US);
Clarence L. Gordon, Iii, Mequon, WI (US);
Fang F. Dong, Waukesha, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Bruce M. Dunham, Mequon, WI (US);
Clarence L. Gordon, III, Mequon, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
The present invention provides a method to detect tube spits and to reduce spit related artifacts in a computed tomography imaging system. A way of detecting tube spit is to monitor the generator kilovolt or milliamp waveforms. Changes in kV waveform follow closely with those in offset-corrected projection data. If a tube-spit event is not detected, processing proceeds without tube spit correction. If a tube-spit event is detected, a tube spit correction is performed. The objective of tube-spit correction is to remove image artifacts due to the occurrence of a tube-spit event.