The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Sep. 16, 2003
Applicants:

Harold W. Chase, Cedar Park, TX (US);

Daniel R. Knebel, Carmel, NY (US);

Dennis G. Menzer, Bedford Hills, NY (US);

Stanislav Polonsky, Mohegan Lake, NY (US);

Pia N. Sanda, Chappagua, NY (US);

Inventors:

Harold W. Chase, Cedar Park, TX (US);

Daniel R. Knebel, Carmel, NY (US);

Dennis G. Menzer, Bedford Hills, NY (US);

Stanislav Polonsky, Mohegan Lake, NY (US);

Pia N. Sanda, Chappagua, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for characterizing circuit activity in an IC. Generally, the method comprises the steps of activating an IC, resolving the switching activity in space and time, and generating a representation of the switching behavior which differentiates the time that circuits or transistors switch. One embodiment of the invention, utilizes a method such as, but not limited to, time resolved photon emission to observe transistor level switching activity in an integrated circuit (IC).


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