The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2006
Filed:
Mar. 06, 2001
Amos Noy, Jerusalem, IL;
Amos Noy, Jerusalem, IL;
Cadence Design (Isreal) II Ltd., Rosh Ha'Ayin, IL;
Abstract
A method and an apparatus for determining functional coverage of a design for a device under test (DUT), the design being encapsulated in a DUT circuit design specification, in a test environment during a design test verification process. The method and apparatus utilize a coverage metric constructed from a plurality of coverage items. A first step involves obtaining a coverage group from the DUT design, for examining during the design test verification process. The coverage group includes at least one functional coverage item. Then, a set of input values is provided to the design test verification process. Next, design test verification process is performed with the set of input test values to obtain a value for each coverage item. Next step involves examining obtained coverage by comparing the value obtained from each coverage item with a coverage goal. Finally, the set of input test value is automatically altered in accordance with the examination of the obtained coverage.