The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Jul. 22, 2002
Applicants:

Steve Klotz, Austin, TX (US);

Michael D. Connell, Pflugerville, TX (US);

Mark J. Lanteigne, Austin, TX (US);

Inventors:

Steve Klotz, Austin, TX (US);

Michael D. Connell, Pflugerville, TX (US);

Mark J. Lanteigne, Austin, TX (US);

Assignee:

Finisar Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention generally provide a system and method for testing integrity of data transmitted across a network connection. In one embodiment, the method generally includes creating one or more test threads on one or more test clients attached to a server through the network connection. The method further includes, for each test thread, generating a data load on the data connection by repetitively writing test data patterns to a common data file on the server, reading data patterns from the common data file, and comparing the data patterns read from the common data file to the test data patterns written to the common data file to detect data corruptions. The method may further include measuring data throughput between the one or more test clients and the server and generating debug information if a data corruption is detected by one of the test threads.


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