The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Jun. 04, 2004
Applicants:

Hisaaki Hatano, Kanagawa-Ken, JP;

Akihiko Nakase, Tokyo, JP;

Inventors:

Hisaaki Hatano, Kanagawa-Ken, JP;

Akihiko Nakase, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A data analyzing apparatus that stores geographic information and observation data including various information regarding an event. A data processing unit generates analyzing data by using the geographic information and the observation data, and a data analyzing unit derives a tendency of occurrence of the event based on the analyzing data. A prediction unit predicts a place where the tendency of occurrence of the event is high by using the tendency and the geographic information. An observation data input unit inputs new observation data, and an analyzing monitor unit controls the data processing unit to generate modified analyzing data by using the new observation data, the observation data and the geographic information, and readjusts the analyzed result based on the modified analyzing data. A health condition observer observes a health condition data, and the observation data input unit inputs the observation data including the health condition data.


Find Patent Forward Citations

Loading…