The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Oct. 31, 2003
Applicant:

Timothy L. Hillstrom, Liberty Lake, WA (US);

Inventor:

Timothy L. Hillstrom, Liberty Lake, WA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of using a vector network analyzer (VNA) for coordinated Voltage Standing-Wave Ratio (VSWR) and Time Domain Reflectometry (TDR) measurement includes configuring the VNA for identifying discontinuities correlated to a VSWR lobe. In some embodiments, the method includes identifying a largest VSWR lobe in a frequency band of interest, using phase data associated with an Sscattering parameter to find the correct electrical delay required to align Low Pass Step Transform data, and configuring the Low Pass Step Transform span and center time to align coherent inductive and capacitive discontinuities relative to grid lines of a TDR display. In some embodiments, the method is automated.


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