The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

May. 04, 2004
Applicants:

Pong Lai, Tucheng, TW;

Ying-tsung LU, Kaohsiung, TW;

Ching-chin Wu, Taichung Hsien, TW;

Inventors:

Pong Lai, Tucheng, TW;

Ying-Tsung Lu, Kaohsiung, TW;

Ching-Chin Wu, Taichung Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An anti-counterfeit method and system by using a nano metal grating, wherein an object to be recognized is formed with the nano metal grating. During the recognition process, an incidental light is applied on the metal grating. In response to the incidental light, the metal grating has its specific optical incidence and reflection characteristics. The object is then identified whether it is genuine or fake by observing the refraction light passing through and reflection light reflected from the metal grating. Further, the incident light beam can be polarized to generate polarized light beams and then irradiated on the metal grating, whereafter the recognition of the object is performed by observing the reflection and refraction lights of the irradiated polarized light beam. The recognition further can be accomplished by rotating the metal grating, thus the intensity of the refraction and reflection lights will accordingly be changed, thereby identifying the object.


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