The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2006
Filed:
Sep. 07, 2000
Toru Matama, Kanagawa, JP;
Toru Matama, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
The image reading method apparatus read an image on an image recording medium by a visible light, read by scanning a specified detecting light in a one-dimensional direction using an optical path of the visible light and detect at least one of a foreign matter which adheres and a scratch which exists in the optical path of the visible light based on continuity of change of light quantity data of the thus read specified detecting light in the one-dimensional direction. The discriminating method of the defect of the image data detects optical defects exiting in the optical system and on the image reading medium. The method and apparatus are capable of obtaining a high-quality print image by preventing the foreign matter such as dust, dirt or the like which adheres or the scratch such as an abrasion, cut or the like which exists in the image reading optical path or on the image recording medium from being transcribed onto a print image by the visible light.