The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2006
Filed:
Aug. 31, 2004
Applicant:
Akio Yoneyama, Kawagoe, JP;
Inventor:
Akio Yoneyama, Kawagoe, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
An imaging apparatus and methods for using the same based upon the interposing of a sample in an X-ray interferometer, such as a Bonse-Hart interferometer. An incident X-ray is split, reflected and combined to form first and second interference beams. When a sample is placed in an optical path of one of the beams, the X-ray intensity, phase and transmission direction of the X-ray beam are altered. A change in the amplitude and phase of the interference beams caused by the sample are obtained using a fringe scanning method, and a detector is used to detect the resulting image.