The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Feb. 12, 2004
Applicant:

Mark Vincent Loen, Steubenville, OH (US);

Inventor:

Mark Vincent Loen, Steubenville, OH (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01); G01C 1/00 (2006.01); G01C 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is described that measures the angular orientation of a rotational axis to a reference line. The reference line is defined by the position of a string. The alignment device includes a collimated light source that is projected approximately perpendicular to a rotating axis. The distance between the projected collimated light beam and the reference line is observed at two or more points. The distances between the reference line and light beam are then used to compute the non-perpendicular alignment angle of the rotational axis relative to the reference line. Other objects, advantages, and contributions are set forth in the disclosing embodiments of the invention.


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