The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Jun. 18, 2004
Applicants:

Dale H. Buermann, Los Altos, CA (US);

Michael J. Mandella, San Jose, CA (US);

Inventors:

Dale H. Buermann, Los Altos, CA (US);

Michael J. Mandella, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01); G06F 3/042 (2006.01);
U.S. Cl.
CPC ...
Abstract

An elongate object optically determines at least one of its orientation parameters relative to a plane surface. A probe radiation beam is directed from the object at various angles σ to various locations on the plane, where the angle σ is a periodic function of time. Two angularly-selective radiation detectors oriented at fixed angles τand τsense scattered portions of the beam from two locations at two corresponding times. The orientation parameter is computed from a time difference Δt=t−tbetween the two times.


Find Patent Forward Citations

Buermann, Dale. (2006). Determination of an orientation parameter of an elongate object with a scan beam apparatus (U.S. Patent No. 7113270). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7113270

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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