The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2006
Filed:
Jan. 12, 2004
David Roderick Gerwe, Woodland Hills, CA (US);
Harold Barry Schall, Oak Park, CA (US);
James Preston Stone, Montrose, CA (US);
David Roderick Gerwe, Woodland Hills, CA (US);
Harold Barry Schall, Oak Park, CA (US);
James Preston Stone, Montrose, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
An optical field sensing system and an associated method are provided that are tolerant of scintillation. The system includes a wavefront sensor that measures gradients across a wavefront at a first resolution defined by the subapertures of the wavefront sensor. The system also includes an intensity sensor that measures the intensity across the wavefront at a higher resolution. The system further includes a wavefront processor that determines respective phases across the wavefront. In addition to the gradients and the intensity measurements, the wavefront processor may determine the respective phases based also upon the noise affiliated with the measurements. In this regard, the wavefront processor may determine the respective phases across the wavefront at least partially based upon the gradients as adjusted by weights that are based upon the intensity measured by the intensity sensor and are influenced by evidence of scintillation.