The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Nov. 10, 2004
Applicants:

Patrick J. Mcginnis, Poughkeepsie, NY (US);

Darrell L. Miles, Wappingers Falls, NY (US);

Richard W. Oldrey, Clintondale, NY (US);

John D. Sylvestri, Poughkeepsie, NY (US);

Manuel J. Villalobos, Wappingers Falls, NY (US);

Inventors:

Patrick J. McGinnis, Poughkeepsie, NY (US);

Darrell L. Miles, Wappingers Falls, NY (US);

Richard W. Oldrey, Clintondale, NY (US);

John D. Sylvestri, Poughkeepsie, NY (US);

Manuel J. Villalobos, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for facilitating single die backside probing of semiconductor devices includes a chip holder configured for receiving a single integrated circuit die attached thereto, the chip holder maintained in flexible engagement in an X-Y orientation with respect to a lift plate. A lift ring is coupled to the lift plate, the lift ring configured to facilitate adjustment of the lift plate and the chip holder in a Z-direction.


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