The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Jun. 20, 2003
Applicant:

Mark Ian Davies, Oxford, GB;

Inventor:

Mark Ian Davies, Oxford, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01R 35/00 (2006.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of calibrating a gauge in particular for the measurement of film thickness, uses a calibration variable to compensate for short term changes in probe tip condition, instead of a constant value. A calibration constant is based only on the dielectric constant for a coating such as lacquer, and is independent of the probe tip variable.


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