The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2006
Filed:
Aug. 02, 2004
Yong Zhou, Waukesha, WI (US);
Kevin Franklin King, New Berlin, WI (US);
Yong Zhou, Waukesha, WI (US);
Kevin Franklin King, New Berlin, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method of measuring and correcting eddy currents in a MRI system includes running a pulse sequence using bipolar gradient pulses and a first delay Te, to acquire a phase-difference image and a phase response of a static phantom that fills a majority of a field of view (FOV) of the MRI system, fitting the phase difference image to a two-dimensional second order polynomial, and changing the pulse sequence to provide a different delay. The method includes iterating running a pulse sequence and fitting the phase difference image and phase response with different delays to determine coefficients of the second order polynomial and a time constant of the phase response, correcting a pre-emphasis eddy current correction (ECC) system of the MRI system in accordance with the time constant of the phase response, determining an amplitude correction to reduce determined coefficients, and storing determined amplitude corrections in the pre-emphasis ECC system.