The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2006
Filed:
Oct. 13, 2004
Volker Höfer, Traunreut, DE;
Volker Höfer, Traunreut, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
An optical position measuring system including a scale and a scanning unit. The scanning unit includes a light source that emits light beams and a periodic scanning graduation having scanning graduation marks arranged periodically at a scanning graduation period along a measuring direction. The scanning unit further including a detector arrangement. The scanning graduation or the scale graduation includes at least three partial tracks, which adjoin perpendicularly with respect to the measuring direction, and graduation marks associated with each of the at least three partial tracks have a defined and constant offset spacing from their nominal positions, wherein the offset spacings associated with adjoining ones of the at least three partial tracks differ, so that filtering of undesired harmonic waves out of the at least one periodic scanning signal results from said offset spacings.