The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Oct. 23, 2002
Applicants:

Yoon-kyoung Cho, Gyeonggi-do, KR;

Sun-hee Kim, Gyeonggi-do, KR;

Kwang-wook OH, Gyeonggi-do, KR;

Geun-bae Lim, Gyeonggi-do, KR;

Dae-sung Yoon, Gyeonggi-do, KR;

Inventors:

Yoon-kyoung Cho, Gyeonggi-do, KR;

Sun-hee Kim, Gyeonggi-do, KR;

Kwang-wook Oh, Gyeonggi-do, KR;

Geun-bae Lim, Gyeonggi-do, KR;

Dae-sung Yoon, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and sensor are provided for detecting the binding of a probe and a target biomolecule by measuring a difference in the shear stress on the surface of the sensor before and after hybridization of the target molecule to the probe, such as nucleic acids or proteins. The shear stress may be measured sensitively and conveniently as an electrical signal without additional fluorescent labeling and without use of expensive additional devices.


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