The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7112194 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 26, 2006

Filed:

Jul. 25, 2003
Applicant:

Masanao Fujieda, Toyohashi, JP;

Inventor:

Masanao Fujieda, Toyohashi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 18/18 (2006.01); A61B 18/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an apparatus for obtaining irradiation intensity of a laser beam, and a laser beam irradiation apparatus that enable obtaining an irradiation intensity distribution of a laser beam easily, and attaining more accurate ablation. The method for obtaining an irradiation intensity of a laser beam has the steps of inputting an intensity of fluorescence emitted from a fluorescent glass, the fluorescence intensity being obtained when the laser beam is irradiated onto the fluorescent glass which emits the fluorescence by irradiation of the laser beam with an ablation area of a size required for processing an object to be processed, and obtaining an irradiation intensity distribution of the laser beam in the ablation area based on the inputted fluorescence intensity.


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