The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Nov. 04, 2004
Applicants:

Edward Henry Chao, Oconomowoc, WI (US);

Wolfgang Just, Riverwood, AU;

Ariel Friedlander, Mequon, WI (US);

Inventors:

Edward Henry Chao, Oconomowoc, WI (US);

Wolfgang Just, Riverwood, AU;

Ariel Friedlander, Mequon, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring table sag of a table may include utilizing images of an unloaded table and a loaded table, plotting pixel values for a range of pixels for each image within a particular column, identifying a pixel within each plot that has a highest pixel value, calculating a difference between the identified pixel row numbers, and converting the difference into a measurement of table sag. A storage medium encoded with machine-readable computer program code for measuring table sag of a table may include instructions for causing a computer to implement the method. A computer for use in an imaging system may utilize digital images for the measurement of table sag and an imaging system may include such a computer.


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