The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2006

Filed:

Apr. 29, 2004
Applicants:

Pedro Lilienfeld, Lexington, MA (US);

Hansgerd Kramer, Erlangen, DE;

Inventors:

Pedro Lilienfeld, Lexington, MA (US);

Hansgerd Kramer, Erlangen, DE;

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A particulate mass monitor includes two mass sensors, such as an optical sensor (e.g., a light scattering photometer or nephelometer) and a beta radiation attenuation sensor for substantially continuous monitoring of ambient particulate matter. During operation, the first mass sensor references the time-averaged measurement of the second mass sensor such that the second mass sensor calibrates the response of the first mass sensor. If the first sensor is an optical sensor, as it detects the presence of particulate matter within a fluid, the mass concentration measurement (e.g., signal output) provided by the optical sensor is altered using a ratio of concentration measurements of the second mass sensor and the optical sensor. The combined use of the two mass sensors provides accurate mass measurements of ambient particulate matter with a relatively high time resolution.


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