The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2006

Filed:

May. 14, 2002
Applicant:

Akihiko Sugawara, Kanagawa, JP;

Inventor:

Akihiko Sugawara, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A plurality of semiconductor integrated circuits have the same configuration as that of an LSI which is subjected to debugging. Different internal signals are respectively collected from the semiconductor integrated circuits under the same operation conditions. The operation of the LSI is analyzed based on the collected internal signals. By doing this, it is not necessary to add output terminals to the LSI or switch the internal signals output from output terminals at periodic time intervals. This facilitates the debugging of the entire LSI in a low-cost and simple configuration.


Find Patent Forward Citations

Sugawara, Akihiko. (2006). Debugging system for semiconductor integrated circuit (U.S. Patent No. 7111212). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7111212

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…