The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
May. 30, 2000
Bijendra N. Jain, Santa Clara, CA (US);
Keith Mccloghrie, San Jose, CA (US);
Bijendra N. Jain, Santa Clara, CA (US);
Keith McCloghrie, San Jose, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
A delay measurement technique according to an embodiment according to the present invention is based on the precept, ascertained by the inventors, that a link between network nodes will often contribute to the delay encountered between several different pairs of network nodes. Such a technique identifies the path between each pair of nodes by a list of links that form the path. Paths that are orthogonal are treated as being necessary for describing the delays encountered between nodes, and, once the requisite set of orthogonal paths has been derived, all other paths can be described in terms of one or more of these orthogonal paths. Such a technique also lends itself to matrix representation of the paths, and the use of matrix manipulation techniques in deriving delay and jitter.