The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Nov. 10, 2000
Federico Garcea, Seattle, WA (US);
Michael S. Murstein, Kirkland, WA (US);
Roger W. Sprague, Redmond, WA (US);
Alexander M. Sutton, Seattle, WA (US);
Michael W. Thomas, Bellevue, WA (US);
Giedrius Zizys, Redmond, WA (US);
Federico Garcea, Seattle, WA (US);
Michael S. Murstein, Kirkland, WA (US);
Roger W. Sprague, Redmond, WA (US);
Alexander M. Sutton, Seattle, WA (US);
Michael W. Thomas, Bellevue, WA (US);
Giedrius Zizys, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A system and method is provided for gathering and aggregating operational metrics (e.g., performance metrics, process events, health monitor state, server state, event metric data, and status metric data) for a plurality of members (e.g., computers, servers, machines) configured as an entity and for a plurality of entities as a singular entity. In one embodiment, the system and method provides for operational metrics of members and entities to be aggregated and retrieved as a single result set, such that entity wide operational metrics can be acquired, monitored and displayed as a single entity. In one embodiment, at least one of the plurality of members has a gathering and aggregation system adapted to gather operational metric data from the plurality of members and aggregate the operational metric data into a unified result set.