The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
May. 15, 2002
Jeffery L. Prewett, Metamora, IL (US);
Evan E. Jacobson, Peoria, IL (US);
Syamala Srinivasan, Peoria, IL (US);
Stephen W. Bird, Peterborough, GB;
Jeffery L. Prewett, Metamora, IL (US);
Evan E. Jacobson, Peoria, IL (US);
Syamala Srinivasan, Peoria, IL (US);
Stephen W. Bird, Peterborough, GB;
Caterpillar Inc., Peoria, IL (US);
Abstract
A method and system may be provided to perform a process for controlling a target system. In one aspect of the invention, the process may include determining a design space (D) including a first set of control data values associated with a set of control variables (X). A model () may be generated that reflects a relationship between the first set of control data values and a first set of response data values associated with a set of response variables (Y). Further, the process may test the model () to determine whether a set of predicted response data values associated with the set of response variables (Y) meets a predetermined criteria based on a set of actual response data values associated with the set of response variables (Y). The design space (D) may then be modified to obtain a relationship between a second set of control data values associated with the set of control variables and a second set of response data values associated with the set of response variables, and the second set of control data values may then be applied to the target system.