The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2006

Filed:

Nov. 09, 2001
Applicants:

Atsusi Wada, Kyoto, JP;

Kouji Egawa, Kyoto, JP;

Inventors:

Atsusi Wada, Kyoto, JP;

Kouji Egawa, Kyoto, JP;

Assignee:

Arkray, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Above a measuring object (), an LEDs () for use in light irradiation and a CMOS area sensor () with an image-forming lens () interpolated in between are installed. In order to detect the quantity of light from the LEDs (), a photodetector () is further placed. A personal computer () carries out a linearizing process which, upon variation of the quantity of light, corrects the output of the area sensor () so as to make the output from the area sensor () proportional to the output of the photodetector (), and a light-irregularity correction process which, when a flat plate having even in-plane density is measured as the measuring object (), corrects the resulting output of each pixel in the area sensor () that has been corrected by the linearizing process to have in-plane evenness. It becomes possible to achieve a convenient two-dimensional reflection factor measuring method which does not need any mechanical driving system.


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