The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Sep. 17, 2004
Rika Baba, Kodaira, JP;
Ken Ueda, Ome, JP;
Masakazu Okabe, Tsuchiura, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
An x-ray measuring apparatus comprises an x-ray source, an x-ray detector, a rotating device, and a processor. The x-ray source generates x-rays to be emitted to a subject. The x-ray detector detects measurement data regarding the subject. The rotating device changes a relative position of the x-ray source and the x-ray detector with respect to the subject. The x-ray detector is shifted by a distance shorter than half the length of the x-ray detector along a line parallel to the plane of rotation, in a tangential direction of the plane of rotation generated by the x-ray source. The processor obtains projection data by executing a logarithmic converting process for the measurement data, multiplies a value of the projection data by a weight, and obtains reconstructed data therefrom.