The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2006

Filed:

Dec. 18, 2003
Applicants:

Heidi Thomé-förster, Azmoos SG, CH;

Claus Heine-kempkens, Chur GR, CH;

Inventors:

Heidi Thomé-Förster, Azmoos SG, CH;

Claus Heine-Kempkens, Chur GR, CH;

Assignee:

Unaxis Balzers Ltd., Blazers, LI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to a platform () and a method for generating electromagnetic field distributions. The invention relates in particular to optical sensors for measuring biological or chemical substances. The platform () according to the invention comprises a substrate (), a structured layer () and, positioned between the substrate () and the structured layer (), a multilayer assembly (), said components being so matched relative to one another that upon appropriate impingement by electromagnetic radiation an electromagnetic field distribution is generated that is at a maximum within the structured layer ().


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