The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Dec. 19, 2001
Selim M. Ünlü, Jamaica Plain, MA (US);
Anna Swan, Cambridge, MA (US);
Bennett B. Goldberg, Newton, MA (US);
Stephen Ippolito, Tampa, FL (US);
Lev Moiseev, Brighton, MA (US);
Samuel Lipolf, Newton, MA (US);
Yunjie Tong, Allston, MA (US);
Selim M. Ünlü, Jamaica Plain, MA (US);
Anna Swan, Cambridge, MA (US);
Bennett B. Goldberg, Newton, MA (US);
Stephen Ippolito, Tampa, FL (US);
Lev Moiseev, Brighton, MA (US);
Samuel Lipolf, Newton, MA (US);
Yunjie Tong, Allston, MA (US);
Trustees of Boston University, Boston, MA (US);
Abstract
A method and apparatus for performing optical microscopy in one to three dimensions employs a spectral self-interference fluorescent microscopy technique that includes providing at least one fluorescent microscopy sample, at least one objective lens, and at least one reflecting surface. The fluorescent sample is disposed between the objective lens and the reflecting surface, the distance from the sample to the reflecting surface being several to several tens times an excitation wavelength. Excitation light causes the fluorescent sample to emit light, at least a portion of which is reflected by the reflecting surface. The objective lens collects the reflected light and the light emitted directly by the fluorescent sample. The direct and reflected light interfere causing spectral oscillations in the emission spectrum. The periodicity and the peak wavelengths of the emission spectrum are spectroscopically analyzed to determine the optical path length between the fluorescent sample and the reflecting surface.