The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7110108 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 19, 2006

Filed:

Jun. 12, 2002
Applicant:

Gerwin Jan Puppels, Rotterdam, NL;

Inventor:

Gerwin Jan Puppels, Rotterdam, NL;

Assignee:

River Diagnostics B.V., Rotterdam, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

The spectrum of light, inelastically scattered by a sample () is measured. The light is guided through a capillary () from and to the sample, at least in one of these directions, through the channel no inelastic scattering of light occurs which can form an interfering background when measuring on the sample. By guiding the light through the channel, inelastic scattering of this light is prevented and it becomes possible to guide scattered light back through the channel to spectral analysis equipment () without problems with inelastic scattering during the guidance of the light. Preferably, the light is guided through the channel of the capillary in both directions.


Find Patent Forward Citations

Puppels, Gerwin. (2006). Spectrometer for measuring inelastically scattered light (U.S. Patent No. 7110108). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7110108

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…