The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2006

Filed:

Jun. 18, 2004
Applicants:

Govind R. Kadambi, Melbourne, FL (US);

Ram M. Narayanan, State College, PA (US);

Yeqin Huang, Harvey, LA (US);

Gordon Evert, Lincoln, NE (US);

James Blake Winter, Lincoln, NE (US);

Inventors:

Govind R. Kadambi, Melbourne, FL (US);

Ram M. Narayanan, State College, PA (US);

Yeqin Huang, Harvey, LA (US);

Gordon Evert, Lincoln, NE (US);

James Blake Winter, Lincoln, NE (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method to measure antenna efficiency using the cavity method. In particular, the present invention provides a tunable cavity that can be tuned to avoid the anti resonance and antenna-cavity coupling problems. In particular, tuning probes and/or variable volumetric sizing of the cavity are used to tune the cavity to avoid the anti resonance and antenna-cavity coupling.


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