The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2006

Filed:

Nov. 20, 2003
Applicants:

Jason Zhen-yu LU, Sparks, NV (US);

Benjamin Luke, Sparks, NV (US);

Allen Jacobs, Reno, NV (US);

Inventors:

Jason Zhen-yu Lu, Sparks, NV (US);

Benjamin Luke, Sparks, NV (US);

Allen Jacobs, Reno, NV (US);

Assignee:

Reno A&E, Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60Q 1/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for automatically testing the integrity of an inductive loop in a vehicle detector system. A check loop is placed adjacent each inductive loop in a multi-channel vehicle detector system. Each check loop is periodically activated by the vehicle detector to simulate a vehicle load on the associated inductive loop. Samples representing loop inductance at different activation periods are compared with a standard. When the result exceeds the standard, the inductive loop is subjected to additional sample testing with decreasing time intervals between sampling. After a number of additional samples exceed the standard, the inductive loop is deemed failed.


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