The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Sep. 24, 2002
Kazunobu Imamoto, Osaka, JP;
Takashi Kimura, Aichi, JP;
Kazunobu Imamoto, Osaka, JP;
Takashi Kimura, Aichi, JP;
Daihatsu Motor Co., Ltd., Osaka, JP;
Magnegraph Co., Ltd., Aichi, JP;
Abstract
A non-destructive inspection includes: magnetizing a target by a first magnetostatic field (S); shutting off the magnetostatic field (S); measuring, at measurement points, the transient change of a differential magnetic flux density of a first residual magnetic field of the target (S); obtaining a first time constant by the main time constant of the transient change at each measurement point (S); magnetizing the target by a second magnetostatic field (S); shutting off the second field (S); measuring, at the measurement points, the transient change of a differential magnetic flux density of a second residual magnetic field of the target (S); obtaining a second time constant by the main time constant of the transient change for each measurement point (S); and obtaining information about the internal structure of the target by the distribution differences between the first and the second time constants at the measurement points (S).
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