The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Jun. 22, 2004
Applicant:
Victor B. Kley, Berkeley, CA (US);
Inventor:
Victor B. Kley, Berkeley, CA (US);
Assignee:
General Nanotechnology LLC, Berkeley, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning probe microscope system () includes an objective lens (), a clamping circuit (), a tip deflection measurement circuit (), a cantilever (), and a probe () for modifying and inspecting an object () disposed on a stage ().