The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Sep. 28, 2004
Andrew Krutchinsky, New York, NY (US);
Herbert Cohen, New York, NY (US);
Markus Kalkum, New York, NY (US);
Vadim Sherman, Brooklyn, NY (US);
Brian Chait, New York, NY (US);
Andrew Krutchinsky, New York, NY (US);
Herbert Cohen, New York, NY (US);
Markus Kalkum, New York, NY (US);
Vadim Sherman, Brooklyn, NY (US);
Brian Chait, New York, NY (US);
The Rockefeller University, New York, NY (US);
Abstract
A system for determining the ratio of mass to charge of an ion including a pulsed ionizer, a high pressure co-linear ion guide/accelerator, and a mass analyzer. The pulsed ionizer generates intact analyte ions from a sample of matter to be analyzed. The high pressure co-linear ion guide/accelerator is interfaced with the ion source for receipt of the intact ions of the sample. The ion guide/accelerator simultaneously dampens and linearly accelerates the intact ions in the substantial absence of fragmentation of the ions to provide a substantially continuous beam of the intact ions for mass analysis. The mass analyzer is connected to the ion guide/accelerator for receipt of the beam of ions and determines the mass to charge ratio of the intact ions.