The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7109047 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 19, 2006

Filed:

Mar. 25, 2005
Applicants:

Yong V. Wang, Fort Collins, CO (US);

Alex Mchardy, Pueblo, CO (US);

Inventors:

Yong V. Wang, Fort Collins, CO (US);

Alex McHardy, Pueblo, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of analyzing a circuit comprising a plurality of interconnects is disclosed herein. The method may comprise analyzing at least one electrical property associated with a first interconnect, wherein the first interconnect has at least one first physical dimension. The electrical property may then be stored. A second interconnect having the at least one first physical dimension may then be located and the at least one electrical property is applied to the second interconnect.


Find Patent Forward Citations

Wang, Yong. (2006). Method and device for analyzing circuits (U.S. Patent No. 7109047). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7109047

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